12
RF Device Data
Freescale Semiconductor
MRF1570NT1 MRF1570FNT1
TYPICAL CHARACTERISTICS
100 120 140 160 180 200
210
1011
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2
for MTTF in a particular application.
1010
108
MTTF FACTOR (HOURS X AMPS
2
)
90 110 130 150 170 190
Figure 31. MTTF Factor versus Junction Temperature
109
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